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ZXMN6A25N8 60V SO8 N-channel enhancement mode MOSFET Summary V(BR)DSS 60 RDS(on) () 0.050 @ VGS=10V 0.070 @ VGS=4.5V ID(A) 7.0 Description This new generation Trench MOSFET from Zetex features low on-resistance and fast switching, making it ideal for high efficiency power management applications. D Features * * * * Low on-resistance Fast switching speed Low gate drive SO8 package G S Applications * * * * DC-DC Converters Power management functions Disconnect switches Motor control S S S G D D D D Top view Ordering information Device ZXMN6A25N8TA Reel size (inches) 7 Tape width (mm) 12 Quantity per reel 500 Device marking ZXMN6A25 Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 1 www.zetex.com ZXMN6A25N8 Absolute maximum ratings Parameter Drain-Source voltage Gate-Source voltage Continuous Drain current @ VGS= 10V; TA=25C @ VGS= 10V; TA=70C @ VGS= 10V; TA=25C @ VGS= 10V; TL=25C Pulsed Drain current (c) (b) (b) (b) (a) (a)(d) Symbol VDSS VGS ID Limit 60 20 5.7 4.5 4.3 7.0 Unit V V A IDM IS ISM PD PD PD Tj, Tstg 25.7 4.1 25.7 1.56 12.5 2.8 22.2 4.14 33.1 -55 to 150 A A A W mW/C W mW/C W mW/C C Continuous Source current (Body diode) Pulsed Source current (Body diode) Power dissipation at TA =25C Linear derating factor Power dissipation at TA =25C Linear derating factor Power dissipation at TL =25C Linear derating factor (a) (b) (d) (c) Operating and storage temperature range Thermal resistance Parameter Junction to ambient Junction to ambient Junction to lead NOTES: (a) (b) (c) (d) For a device surface mounted on 25mm x 25mm x 1.6mm FR4 PCB with high coverage of single sided 1oz copper, in still air conditions. Mounted on FR4 PCB measured at t 10 sec. Repetitive rating on 25mm x 25mm FR4 PCB, D=0.02, pulse width 300us - pulse width limited by maximum junction temperature. Thermal resistance from junction to solder-point (at the end of the drain lead). Symbol (a) (b) Value 80 45 30.2 Unit C/W C/W C/W RJA RJA RJL (d) Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 2 www.zetex.com ZXMN6A25N8 Thermal characteristics Max Power Dissipation (W) ID Drain Current (A) 10 Limited 1 DC 1s 100ms 10ms 1ms 100s RDS(on) 1.6 1.4 1.2 1.0 0.8 0.6 0.4 0.2 0.0 0 20 40 60 80 100 120 140 160 25mm x 25mm 1oz FR4 100m 10m 1m 100m Single Pulse Tamb=25C VDS Drain-Source Voltage (V) 1 10 Temperature (C) Safe Operating Area Derating Curve Thermal Resistance (C/W) 80 70 60 50 40 30 20 10 0 100 Maximum Power (W) T amb=25C 100 Single Pulse T amb=25C D=0.5 10 D=0.2 D=0.1 Single Pulse D=0.05 1m 10m 100m Pulse Width (s) 1 10 100 1k 1 100 1m 10m 100m 1 10 100 1k Transient Thermal Impedance Pulse Width (s) Pulse Power Dissipation Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 3 www.zetex.com ZXMN6A25N8 Electrical characteristics (at Tamb = 25C unless otherwise stated) Parameter Static Drain-Source breakdown voltage Zero gate voltage drain current Gate-Body leakage Gate-Source threshold voltage Static Drain-Source () on-state resistance * Forward ( ) () Transconductance * Dynamic () Symbol V(BR)DSS IDSS IGSS VGS(th) RDS(on) gfs Min. 60 Typ. Max. Unit V Conditions ID =250A, VGS=0V VDS=60V, VGS=0V VGS=20V, VDS=0V ID=250A, VDS=VGS VGS= 10V, ID= 3.6A VGS= 4.5V, ID= 3.0A VDS= 15V, ID= 4.5A 1.0 100 1 3 0.050 0.070 10.2 A nA V S Input capacitance Output capacitance Reverse transfer capacitance Switching () () Ciss Coss Crss 1063 104 64 pF pF pF VDS= 30V, VGS=0V f=1MHz Turn-on-delay time Rise time Turn-off delay time Fall time Gate charge Total gate charge Gate-Source charge Gate-Drain charge Source-Drain diode Diode forward voltage Reverse recovery time () td(on) tr td(off) tf Qg Qg Qgs Qgd 3.8 4.0 26.2 10.6 11.0 20.4 4.1 5.1 ns ns ns ns nC nC nC nC VDS= 30V, VGS= 10V ID= 4.5A VDD= 30V, VGS= 10V ID= 1A RG 6.0, VDS= 30V, VGS= 5V ID= 4.5A * VSD trr Qrr () 0.85 22.0 21.4 0.95 V ns nC IS= 5.5A,VGS=0V IS= 2.2A,di/dt=100A/s () Reverse recovery charge NOTES: (*) Measured under pulsed conditions. Pulse width 300s; duty cycle 2%. ()Switching characteristics are independent of operating junction temperature. ()For design aid only, not subject to production testing Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 4 www.zetex.com ZXMN6A25N8 Typical characteristics T = 25C 10V 4.5V T = 150C 10V 4.5V 4V 3.5V 3V 2.5V VGS 2V ID Drain Current (A) 3.5V 1 3V ID Drain Current (A) 10 4V 10 1 0.1 VGS 2.5V 0.1 0.01 0.1 1 10 0.01 0.1 1 10 VDS Drain-Source Voltage (V) VDS Drain-Source Voltage (V) Output Characteristics 1.4 Normalised RDS(on) and VGS(th) 10 Output Characteristics ID Drain Current (A) 1.2 1.0 0.8 0.6 0.4 -50 VGS = 10V ID = 4.5A RDS(on) T = 150C 1 T = 25C VGS(th) VGS = VDS ID = 250uA 0.1 VDS = 10V 0.01 VGS Gate-Source Voltage (V) 2 3 4 5 Tj Junction Temperature (C) 0 50 100 150 Typical Transfer Characteristics RDS(on) Drain-Source On-Resistance () 1000 100 10 1 0.1 0.01 0.01 0.1 1 10 2.5V VGS 3V 3.5V 4V 4.5V 10V T = 25C Normalised Curves v Temperature 100 ISD Reverse Drain Current (A) T = 150C 10 T = 25C 1 0.1 0.01 0.2 On-Resistance v Drain Current ID Drain Current (A) VSD Source-Drain Voltage (V) 0.4 0.6 0.8 1.0 1.2 Source-Drain Diode Forward Voltage Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 5 www.zetex.com ZXMN6A25N8 Typical characteristics 1600 1400 10 f = 1MHz VGS Gate-Source Voltage (V) VGS = 0V ID = 4.5A C Capacitance (pF) 1200 1000 800 600 400 200 0 0.1 1 CISS COSS 8 6 4 2 VDS = 30V CRSS VDS - Drain - Source Voltage (V) 10 0 0 5 10 15 20 25 Capacitance v Drain-Source Voltage Q - Charge (nC) Gate-Source Voltage v Gate Charge Test circuits Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 6 www.zetex.com ZXMN6A25N8 Package outline SO8 SO8 Package Information DIM Inches Min. Max. 0.069 0.010 0.197 0.244 0.157 0.050 Millimeters Min. 1.35 0.10 4.80 5.80 3.80 0.40 Max. 1.75 0.25 5.00 6.20 4.00 1.27 DIM Inches Min. Max. Millimeters Min. Max. A A1 D H E L 0.053 0.004 0.189 0.228 0.150 0.016 e b c U h - 0.050 BSC 0.013 0.008 0 0.010 0.020 0.010 8 0.020 - 1.27 BSC 0.33 0.19 0 0.25 0.51 0.25 8 0.50 - Note: Controlling dimensions are in inches. Approximate dimensions are provided in millimeters Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 7 www.zetex.com ZXMN6A25N8 Definitions Product change Zetex Semiconductors reserves the right to alter, without notice, specifications, design, price or conditions of supply of any product or service. Customers are solely responsible for obtaining the latest relevant information before placing orders. Applications disclaimer The circuits in this design/application note are offered as design ideas. It is the responsibility of the user to ensure that the circuit is fit for the user's application and meets with the user's requirements. No representation or warranty is given and no liability whatsoever is assumed by Zetex with respect to the accuracy or use of such information, or infringement of patents or other intellectual property rights arising from such use or otherwise. Zetex does not assume any legal responsibility or will not be held legally liable (whether in contract, tort (including negligence), breach of statutory duty, restriction or otherwise) for any damages, loss of profit, business, contract, opportunity or consequential loss in the use of these circuit applications, under any circumstances. Life support Zetex products are specifically not authorized for use as critical components in life support devices or systems without the express written approval of the Chief Executive Officer of Zetex Semiconductors plc. As used herein: A. Life support devices or systems are devices or systems which: 1. are intended to implant into the body or 2. support or sustain life and whose failure to perform when properly used in accordance with instructions for use provided in the labeling can be reasonably expected to result in significant injury to the user. B. A critical component is any component in a life support device or system whose failure to perform can be reasonably expected to cause the failure of the life support device or to affect its safety or effectiveness. Reproduction The product specifications contained in this publication are issued to provide outline information only which (unless agreed by the company in writing) may not be used, applied or reproduced for any purpose or form part of any order or contract or be regarded as a representation relating to the products or services concerned. Terms and Conditions All products are sold subjects to Zetex' terms and conditions of sale, and this disclaimer (save in the event of a conflict between the two when the terms of the contract shall prevail) according to region, supplied at the time of order acknowledgement. For the latest information on technology, delivery terms and conditions and prices, please contact your nearest Zetex sales office. Quality of product Zetex is an ISO 9001 and TS16949 certified semiconductor manufacturer. To ensure quality of service and products we strongly advise the purchase of parts directly from Zetex Semiconductors or one of our regionally authorized distributors. For a complete listing of authorized distributors please visit: www.zetex.com/salesnetwork Zetex Semiconductors does not warrant or accept any liability whatsoever in respect of any parts purchased through unauthorized sales channels. ESD (Electrostatic discharge) Semiconductor devices are susceptible to damage by ESD. Suitable precautions should be taken when handling and transporting devices. The possible damage to devices depends on the circumstances of the handling and transporting, and the nature of the device. The extent of damage can vary from immediate functional or parametric malfunction to degradation of function or performance in use over time. Devices suspected of being affected should be replaced. Green compliance Zetex Semiconductors is committed to environmental excellence in all aspects of its operations which includes meeting or exceeding regulatory requirements with respect to the use of hazardous substances. Numerous successful programs have been implemented to reduce the use of hazardous substances and/or emissions. All Zetex components are compliant with the RoHS directive, and through this it is supporting its customers in their compliance with WEEE and ELV directives. Product status key: "Preview" Future device intended for production at some point. Samples may be available "Active" Product status recommended for new designs "Last time buy (LTB)" Device will be discontinued and last time buy period and delivery is in effect "Not recommended for new designs" Device is still in production to support existing designs and production "Obsolete" Production has been discontinued Datasheet status key: "Draft version" This term denotes a very early datasheet version and contains highly provisional information, which may change in any manner without notice. "Provisional version" This term denotes a pre-release datasheet. It provides a clear indication of anticipated performance. However, changes to the test conditions and specifications may occur, at any time and without notice. "Issue" This term denotes an issued datasheet containing finalized specifications. However, changes to specifications may occur, at any time and without notice. Zetex sales offices Europe Zetex GmbH Kustermann-Park Balanstrae 59 D-81541 Munchen Germany Telefon: (49) 89 45 49 49 0 Fax: (49) 89 45 49 49 49 europe.sales@zetex.com Americas Zetex Inc 700 Veterans Memorial Highway Hauppauge, NY 11788 USA Telephone: (1) 631 360 2222 Fax: (1) 631 360 8222 usa.sales@zetex.com Asia Pacific Zetex (Asia Ltd) 3701-04 Metroplaza Tower 1 Hing Fong Road, Kwai Fong Hong Kong Telephone: (852) 26100 611 Fax: (852) 24250 494 asia.sales@zetex.com Corporate Headquarters Zetex Semiconductors plc Zetex Technology Park, Chadderton Oldham, OL9 9LL United Kingdom Telephone (44) 161 622 4444 Fax: (44) 161 622 4446 hq@zetex.com (c) 2008 Published by Zetex Semiconductors plc Issue 1 - April 2008 (c) Zetex Semiconductors plc 2008 8 www.zetex.com |
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